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L2-60

9 399 RUB
7 519 UAH
available:
1 piece

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Measuring the parameters of semiconductor devices and integrated circuits L2-60 (L260, L 2 60, L-2-60, L 260, L-260, L2 60)
Measuring the parameters of semiconductor devices and integrated circuits L2-60 is designed to determine suitability of the findings from HUD to 16 by checking them to perform logic functions.
The presence of removable loads and probe heads allows you to check the HUD in different buildings. To reduce the measurement error is possible to connect an external voltmeter.
Technical characteristics of the instrument measuring the parameters of semiconductor devices and integrated circuits L2-60:
Number of outputs checked HUD - 16;
Range:
- DC voltage - ± (0,1-30) B;
- Input Current - 0.03 mA 3 mA;
Measurement error A2-60 - 4%;
The limits of the voltage setting:
- A logical "0» - U 0 - 0.2 V-3B;
- Logic "1» - U 1 U 0 - 10 V;
Meals scanned the HUD from the two sources of tension:
- ± (0,3-30) at I n ≤ 60 mA;
- ± (1-15) at I n ≤ 30 mA;
Dimensions - 300h205h185mm;
Weight - 5kg.

Photos: L2-60

L2-60 device image.
L2-60 device image.
L2-60 front view.
L2-60 front view.
L2-60 side view.
L2-60 side view.
L2-60 rear view.
L2-60 rear view.
L2-60 overhead view.
L2-60 overhead view.
L2-60 bottom view.
L2-60 bottom view.


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