Radiometric devices >> radio component testers

L2-56A

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Measuring parameters of semiconductor devices and integrated circuits L2-56A (L256A, L 2 56 A, L-2-56-A, L 256A, L-256A, L 256A, L-256A)
 
Measuring parameters of semiconductor devices and integrated circuits L2-56A is designed to measure the parameters of various semiconductor devices.
 
Technical characteristics of the instrument gauges the parameters of semiconductor devices and integrated circuits L2-56A:
 
Measuring range of input voltages - from 1mkV to 400mV;
Accuracy of measurement device measuring the parameters of semiconductor devices and integrated circuits L2-56A - from 3% to 5% of full scale;
Measuring range of supply voltage of the collector circuit - from 0V to 2000V.
 


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