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L2-54

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Measuring the parameters of semiconductor devices and integrated circuits L2-54 (L254, L 2 54, L-2-54, L 254, L-254, L2 54)
Measuring the parameters of semiconductor devices and integrated circuits L2-54 is designed for assessing the performance of low-power transistors and diodes, low and medium power by measuring its various parameters.
Technical characteristics of the instrument measuring the parameters of semiconductor devices and integrated circuits L2-54:
Range:
- Reverse current collectors of transistors and diodes 10 -8 -4 A-10 A;
- Current transfer ratio of transistors 0.9-1;
- Output conductivity of 0.4 mS-4mkSm;
- Forward voltage diode 0.1V-3V;
- Zener voltage 3V-30V;
Measurement error A2-54:
- Reverse-current diodes and the collectors of transistors 15 (10 -8, 10 -7 A A);
- Other parameters - 5;
Modes of measurement:
- Transistors
- I e = 1mA, I e = 5 mA;
- U k = 4.5 V, U k = 4.5;
- LEDs:
- I pr = 5 mA, 100 mA (from an internal source);
- I pr = 5 mA, 300 mA (from external sources);
- U mod = 10V-400V;
The error mode setting L2-54 - ≤ 2%;
Power supply - 220V, 50Hz, 6 elements "373" total voltage of 9V;
Power consumption - 12 V ∙ A;
Dimensions - 300h205h185mm;
Weight - 6kg.

Photos: L2-54

L2-54 device image.
L2-54 device image.
L2-54 front view.
L2-54 front view.
L2-54 side view.
L2-54 side view.
L2-54 rear view.
L2-54 rear view.
L2-54 overhead view.
L2-54 overhead view.
L2-54 bottom view.
L2-54 bottom view.


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